著者典拠情報

標目形：
Ponce, Fernando A.
属性：
Personal
注記：
High resolution microscopy of materials, c1989: CIP t.p. (Fernando A. Ponce; Xerox PARC, Palo Alto, Calif.)
Spectroscopic characterization techniques for semi-conductor ... c1988: t.p. (Fernando Ponce) p. vii (Xerox Palo Alto Research Center)
著者典拠ID：
DA03833079


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1.

図書
図書
1. Nitride semiconductors : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.
editors, F.A. Ponce ... [et al.]
出版情報: Warrendale, Pa. : Materials Research Society, c1998
シリーズ名: Materials Research Society symposium proceedings ; v. 482
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2.

図書
図書
2. III-V nitrides : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A.
editors F.A. Ponce ... [et al.]
出版情報: Pittsburgh, PA : Materials Research Society, c1997
シリーズ名: Materials Research Society symposium proceedings ; v. 449
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3.

図書
図書
3. Gallium nitride and related materials : the First International Symposium on Gallium Nitride and Related Materials held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.
editors, F.A. Ponce ... [et al.]
出版情報: Pittsburgh, Pa. : Materials Research Society, c1996
シリーズ名: Materials Research Society symposium proceedings ; v. 395
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4.

図書
図書
4. High resolution microscopy of materials : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A.
editors, William Krakow, Fernando A. Ponce, David J. Smith
出版情報: Pittsburgh, Pa. : Materials Research Society, c1989
シリーズ名: Materials Research Society symposium proceedings ; v. 139
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