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Field-ion microscopy

フォーマット:
図書
責任表示:
K. Bowkett and D.A. Smith
言語:
英語
出版情報:
Amsterdam : North-Holland
New Yrok : Sole distributed for the U.S.A. and Canada, American Elsevier, 1970
形態:
x, 257 p. : ill. ; 23 cm
著者名:
シリーズ名:
Defects in crystalline solids ; v. 2 <BA00818709>
書誌ID:
BA09972399
ISBN:
9780720417524 [072041752X] (: ne)  CiNii Books  Webcat Plus  Google Books
9780444100047 [0444100040] (: us)  CiNii Books  Webcat Plus  Google Books
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