著者典拠情報

標目形：
Sinclair, Robert
属性：
Personal
注記：
Characterization of defects in materials, c1987 : t. p. (Robert Sinclair, Stanford university, Stanford, Calif.)
著者典拠ID：
DA01896034


 close
1.

図書
図書
1. High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA
editors, Robert Sinclair, David J. Smith, Ulrich Dahmen
出版情報: Pittsburgh, Pa. : Materials Research Society, c1990
シリーズ名: Materials Research Society symposium proceedings ; v. 183
所蔵情報: loading…
2.

図書
図書
2. Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.
editors, Richard W. Siegel, Julia R. Weertman, Robert Sinclair
出版情報: Pittsburgh, Pa. : Materials Research Society, c1987
シリーズ名: Materials Research Society symposia proceedings ; v. 82
所蔵情報: loading…