著者典拠情報

標目形：
Siegel, Richard W.
属性：
Personal
から見よ参照形：
Siegel, R. W.
注記：
International Conference on the Properties of Atomic Defects in Metals, Argonne, Ill., 1976. Proceedings ... 1978 (a.e.) t.p. (R. W. Siegel) CIP data sheet (Richard W. Siegel)
Atomic migration and defects in materials, 1991: pref. (R.W. Siegel, Mater. Sci. Div., Argonne Natl. Lab.)
著者典拠ID：
DA01850769


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1.

図書
図書
1. Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.
editors, Richard W. Siegel, Julia R. Weertman, Robert Sinclair
出版情報: Pittsburgh, Pa. : Materials Research Society, c1987
シリーズ名: Materials Research Society symposia proceedings ; v. 82
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2.

図書
図書
2. Properties of atomic defects in metals : proceedings of the International Conference on the Properties of Atomic Defects in Metals, Argonne, Illinois, USA, 18-22 October, 1976
editors, N. L. Peterson, R. W. Siegel
出版情報: Amsterdam : North-Holland Pub. Co. : New York : sole distributors in the U.S. and Canada, Elsevier North-Holland, 1978
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