著者典拠情報

標目形：
INSPEC (Information service)
属性：
Corporate
から見よ参照形：
Institution of Electrical Engineers. Information Services Division
Institution of Electrical Engineers. INSPEC
注記：
EMIS datareviews series ; no. 1. Properties of amorphous silicon, c1985: t.p. (INSPEC) verso t.p. (INSPEC, Information Services Division of the Institution of Electrical Engineers)
nuc87-101945: Birefringence in crystals ... 1984? (hdg. on FMU rept.: Information Services for the Physics and Engineering Communities; usage: INSPEC)
EDSRC:Key abstracts. Electronic circuits(INSPEC, 1975-)
著者典拠ID：
DA01728470


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1.

図書
図書
1. Properties of group III nitrides
edited by James H. Edgar
出版情報: London : INSPEC, the Institution of Electrical Engineers, c1994
シリーズ名: EMIS datareviews series ; no. 11
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2.

図書
図書
2. Ion-solid interactions : a comprehensive bibliography (v. 1 ; v. 2 ; v. 3)
[compiled by] Walter M. Gibson, Henry H. Teitelbaum
出版情報: London : INSPEC, c1980
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3.

雑誌
雑誌
3. Science abstracts. Sect. B, Electrical and electronics abstracts
Institution of Electrical Engineers ; Institute of Electrical and Electronics Engineers ; INSPEC (Information service)
出版情報: London : Institution of Electrical Engineers, 1966-
巻次(年次): Vol. 69, no. 817 (1966)-v. 94, no. 1128 (Dec. 1991) ; 1992, no. 1 (Jan. 1992)-
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4.

雑誌
雑誌
4. Science abstracts. Sect. A, Physics abstracts
Institution of Electrical Engineers ; American Institute of Physics ; Institute of Electrical and Electronics Engineers ; INSPEC (Information service)
出版情報: London : Institution of Electrical Engineers, 1941-
巻次(年次): Vol. 44 (1941)-v. 94, no. 1414 (Dec. 1991) ; 1992, no. 1 (Jan. 1992)-
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