著者典拠情報

標目形：
Symposium on Defect Properties and Processing of High-Technology Nonmetallic Materials
属性：
Meeting
場所：
Boston, Mass.
日付：
1983;1985
注記：
Defect properties and processing of high-technology nonmetallic materials, c1984. (Symposium held Nov. 14-17, 1983, Boston, Mass.)
Defect properties and processing of high-technology nonmetallic materials, c1986: CIP t.p. (symposium held Dec. 2-4, 1985, Boston, Mass.) CIP pref. (Symposium on Defect Properties and Processing of High-Technology Nonmetallic Materials)
著者典拠ID：
DA00782153


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1.

図書
図書
1. Defect properties and processing of high-technology nonmetallic materials : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.
editors, Y. Chen, W.D. Kingery, R.J. Stokes
出版情報: Pittsburgh, Pa. : Materials Research Society, c1986
シリーズ名: Materials Research Society symposia proceedings ; v. 60
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2.

図書
図書
2. Defect properties and processing of high-technology nonmetallic materials : symposium held November 1983 in Boston, Massachusetts, U.S.A.
editors, J.H. Crawford, Jr., Y. Chen, W.A. Sibley
出版情報: New York : North-Holland : Published [i.e. Distributed] by Elsevier Science Pub. Co., c1984
シリーズ名: Materials Research Society symposia proceedings ; v. 24
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