著者典拠情報

標目形：
Pantelides, Sokrates T., 1948-
属性：
Personal
日付：
1948
から見よ参照形：
Pantelides, S. T. (Sokrates T.)
注記：
International Topical Conf. on the Physics of Si02 and Its Interfaces, Yorktown Heights, N. Y., 1978. The physics ... 1978 (a.e.) t.p. (Sokrates T. Pantelides; IBM, Yorktown Hghts.)
Internat'l Topical Conf. on the Physics of MOS Insulators, N.C. St.U., 1980. The physics of MOS insulators, 1980: t.p. (Sokrates T. Pantelides) CIP data sheet (Sokrates Theodore Pantelides; b. 11/20/48)
Computer-based microscopic description of the structure and properties of materials, c1986: CIP t.p. (S.T. Pantelides)
著者典拠ID：
DA0057273X


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1.

図書
図書
1. Defects in microelectronic materials and devices
edited by Daniel M. Fleetwood, Sokrates T. Pantelides, Ronald D. Schrimpf
出版情報: Boca Raton : CRC Press, c2009
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2.

図書
図書
2. SiO[2] and its interfaces : symposium held November 30-December 5, 1987, Boston, Massachusetts, U.S.A.
editors, S.T. Pantelides, G. Lucovsk
出版情報: Pittsburgh, Pa. : Materials Research Society, c1988
シリーズ名: Materials Research Society symposia proceedings ; v. 105
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3.

図書
図書
3. Computer-based microscopic description of the structure and properties of materials : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.
editors, J. Broughton, W. Krakow, S.T. Pantelides
出版情報: Pittsburgh, Pa. : Materials Research Society, c1986
シリーズ名: Materials Research Society symposium proceedings ; v. 63
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