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Pattern recognition and machine learning : proceedings of the Japan-U.S. Seminar on the Learning Process in Control Systems, held in Nagoya, Japan, August 18-20, 1970

フォーマット:
図書
責任表示:
edited by K.S. Fu
言語:
英語
出版情報:
New York : Plenum Press, 1971
形態:
ix, 343 p. : ill. ; 26 cm
著者名:
書誌ID:
BA07290398
ISBN:
9780306305467 [0306305461]  CiNii Books  Webcat Plus  Google Books
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