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Scanning Probe Microscopy : Electrical and Electromechanical Phenomena at the Nanoscale

フォーマット:
電子ブック
責任表示:
edited by Sergei Kalinin, Alexei Gruverman
言語:
英語
出版情報:
New York, NY : Springer Science+Business Media, LLC, 2007
形態:
v.: digital
著者名:
書誌ID:
NB02213061
ISBN:
9780387286686 [0387286683]  CiNii Books  Webcat Plus  Google Books
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