Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach

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Nanoscale characterisation of ferroelectric materials : scanning probe microscopy approach

フォーマット:

図書

責任表示:

M. Alexe, A. Gruverman, Eds

言語:

英語

出版情報:

Berlin : Springer, c2004

形態:

xiii, 282p. : ill. ; 24 cm

著者名:

シリーズ名:

Nanoscience and technology <BA33734375>

書誌ID:

BA67035785

ISSN:

14344904

ISBN:

9783540206620 [3540206620]

子書誌情報

所蔵情報

タイトルが類似している資料

詳細

主題:	Nanostructured materials; Nanotechnology
分類・件名:	LCC : TA418.9.N35 DC22 : 620/.5 LCSH : Nanostructured materials LCSH : Nanotechnology
LCCN:	2004040666
注記:	Includes bibliographical references and index
TTLL:	eng

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