著者典拠情報

標目形：
IEEE Reliability Society
属性：
Corporate
から見よ参照形：
Institute of Electrical and Electronics Engineers. Reliability Society
I.E.E.E. Reliability Society
からも見よ参照形：
IEEE Reliability Group
注記：
Workshop on Quantitative Software Models (1979 : Kaimesha Lake, N.Y.). Workshop on Quantitative Software ... c1979 (a.e.) t.p. (IEEE Reliability Society)
FTS call to society's president, 10/13/81 (IEEE Reliability Group chgd. its name in 1979 to IEEE Reliability Society)
著者典拠ID：
DA03215295


 close
1.

図書
図書
1. 2000 IEEE International Reliability Physics Symposium proceedings : 38th annual, San Jose, California, April 10-13, 2000 (: soft. ; : case.)
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N. J. : Institute of Electrical and Electronics Engineers, c2000
所蔵情報: loading…
2.

雑誌
雑誌
2. IEEE transactions on semiconductor manufacturing : a publication of the IEEE Components, Hybrids, and Manufacturing Technology Society, the IEEE Electron Devices Society, the IEEE Reliability Society, the IEEE Solid-State Circuits Council
Institute of Electrical and Electronics Engineers
出版情報: New York, N.Y. : Institute of Electrical and Electronics Engineers, c1988-
巻次(年次): Vol. 1, no. 1 (Feb. 1988)-
所蔵情報: loading…