著者典拠情報

標目形：
Johnson, Noble M.
属性：
Personal
注記：
Energy beam-solid interactions and transient thermal processing, c1984: CIP t.p. (Noble M. Johnson; Xerox Palo Alto Res. Center, Calif.)
著者典拠ID：
DA02347450


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1.

図書
図書
1. Hydrogen in semiconductors ([1] ; 2)
volume editors, Jacques I. Pankove, Noble M. Johnson
出版情報: Boston ; Tokyo : Academic Press, c1991-1999
シリーズ名: Semiconductors and semimetals ; v. 34, 61
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2.

図書
図書
2. Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.
editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins
出版情報: Pittsburgh, Pa. : Materials Research Society, c1985
シリーズ名: Materials Research Society symposia proceedings ; v. 46
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3.

図書
図書
3. Energy beam-solid interactions and transient thermal processing : symposium held November 1983 in Boston, Massachusetts, U.S.A.
editors, John C.C. Fan, Noble M. Johnson
出版情報: New York : North-Holland, c1984
シリーズ名: Materials Research Society symposia proceedings ; v. 23
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