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Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.

フォーマット:
図書
責任表示:
editors, Richard W. Siegel, Julia R. Weertman, Robert Sinclair
言語:
英語
出版情報:
Pittsburgh, Pa. : Materials Research Society, c1987
形態:
xv, 532 p. : ill. ; 24 cm
著者名:
Siegel, Richard W. <DA01850769>
Sinclair, Robert <DA01896034>
Weertman, Julia R. (Julia Randall) <DA01896067>
Materials Research Society <DA00024949>
Materials Research Society. Meeting <DA00721013>
Symposium on the Characterization of Defects in Materials <DA03092559>
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シリーズ名:
Materials Research Society symposia proceedings ; v. 82 <BA00013775>
書誌ID:
BA01314391
ISBN:
9780931837470 [0931837472]  CiNii Books  Webcat Plus  Google Books
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