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1.

図書
図書
1. Statistical control by monitoring and adjustment. 2nd ed (: pbk)
George E.P. Box, Alberto Luceño, María del Carmen Paniagua-Quiñones
出版情報: Hoboken, N.J. : John Wiley & Sons, c2009
シリーズ名: Wiley series in probability and mathematical statistics
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2.

図書
図書
2. Fundamentals of semiconductor manufacturing and process control
Gary S. May, Costas J. Spanos
出版情報: [Piscataway] : IEEE , Hoboken, N.J. : Wiley-Interscience, c2006
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3.

図書
図書
3. Encyclopedia and handbook of process capability indices : a comprehensive exposition of quality control measures
W.L. Pearn, Samuel Kotz
出版情報: Singapore : World Scientific, c2006
シリーズ名: Series on quality, reliability, and engineering statistics ; v. 12
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4.

図書
図書
4. Statistical methods for quality improvement. 2nd ed
Thomas P. Ryan
出版情報: New York : Wiley, c2000
シリーズ名: Wiley series in probability and mathematical statistics ; . Applied probability and statistics section
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5.

図書
図書
5. Statistical procedures for machine and process qualification
Edgar Dietrich, Alfred Schulze
出版情報: Milwaukee, Wis. : ASQ Quality Press, c1999
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6.

図書
図書
6. Statistical control by monitoring and feedback adjustment
George Box, Alberto Luceño
出版情報: New York : Wiley, c1997
シリーズ名: Wiley series in probability and mathematical statistics ; Applied probability and statistics
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7.

図書
図書
7. Statistical applications in process control ((hardcover : alk. paper))
edited by J. Bert Keats, Douglas C. Montgomery
出版情報: New York : M. Dekker, 1996
シリーズ名: Quality and reliability ; 47
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8.

図書
図書
8. Real-time statistical process control
Paul C. Badavas
出版情報: Englewood Cliffs, N.J. : Prentice Hall, c1993
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9.

図書
図書
9. Statistical process control in manufacturing
edited by J. Bert Keats, Douglas C. Montgomery
出版情報: New York : Marcel Dekker, c1991
シリーズ名: Quality and reliability ; 23
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10.

図書
図書
10. Statistical methods for quality improvement
Thomas P. Ryan
出版情報: New York : Wiley, c1989
シリーズ名: Wiley series in probability and mathematical statistics ; . Applied probability and statistics
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