Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics : symposium held April 10-12, 2007, San Francisco, California, U.S.A.
- フォーマット:
- 図書
- 責任表示:
- editors: Qinghuang Lin ... [et al.]
- 言語:
- 英語
- 出版情報:
- Warrendale, Pa. : Materials Research Society, c2007
- 形態:
- xiv, 338 p. : ill. ; 24 cm
- 著者名:
- シリーズ名:
- Materials Research Society symposium proceedings ; v. 990 <BA00013775>
- 書誌ID:
- BA83416338
- ISBN:
- 9781558999503 [1558999507]
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