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The electrical noise of reverse bias breakdown in silicon p-n junctions

フォーマット:
図書
責任表示:
keith Schaffner Champlin
言語:
英語
出版情報:
Ann Arbor, London : University Microfilms, [19--?]
形態:
97 leaves ; 21 cm
著者名:
Champlin, keith Schaffner  
書誌ID:
BA90473218
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