Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability

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Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability

フォーマット:

電子ブック

責任表示:

edited by Mohammad Tehranipoor

言語:

英語

出版情報:

Boston, MA : Springer Science+Business Media, LLC, 2008

形態:

v.: digital

著者名:

シリーズ名:

Frontiers in Electronic Testing ; 37

書誌ID:

NB02213584

ISBN:

9780387747477 [0387747478]

学内からのみアクセスすることができます。

子書誌情報

オンライン

http://dx.doi.org/10.1007/978-0-387-74747-7

所蔵情報

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詳細

主題:	Circuits and Systems; Electronic and Computer Engineering; Electronics and Microelectronics, Instrumentation; Engineering; Nanotechnology; Quality Control, Reliability, Safety and Risk
分類・件名:	LCSH : Computer engineering LCSH : Electronics LCSH : Engineering LCSH : Nanotechnology LCSH : System safety LCSH : Systems engineering FREE : Engineering FREE : Circuits and Systems FREE : Electronic and Computer Engineering FREE : Electronics and Microelectronics, Instrumentation FREE : Nanotechnology FREE : Quality Control, Reliability, Safety and Risk
TTLL:	eng

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