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System and Bayesian reliability : essays in honor of Professor Richard E. Barlow on his 70th birthday

フォーマット:
図書
責任表示:
editors Yu Hayakawa, Telbe, Irony, Min Xie
言語:
英語
出版情報:
Singapore ; River Edge, NJ : World Scientific, c2001
形態:
xxvii, 409 p. : ill. ; 23 cm
著者名:
シリーズ名:
Series on quality, reliability, and engineering statistics ; v. 5 <BA37266563>
書誌ID:
BA5655566X
ISBN:
9789810248659 [9810248652]  CiNii Books  Webcat Plus  Google Books
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