Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.

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Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.

フォーマット:

図書

責任表示:

editors, Javier Piqueras ... [et al.]

言語:

英語

出版情報:

Warrendale, Pa. : Materials Research Society, c2003

形態:

xiii, 425 p. : ill. ; 24 cm

著者名:

シリーズ名:

Materials Research Society symposium proceedings ; v. 738 <BA00013775>

書誌ID:

BA62101317

ISBN:

9781558996755 [1558996753]

子書誌情報

所蔵情報

タイトルが類似している資料

詳細

主題:	工業基礎学
注記:	Includes bibliographical references and indexes
TTLL:	eng

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