Advanced data storage materials and characterization techniques : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A.
- フォーマット:
- 図書
- 責任表示:
- editors, symposium GG, Joachim W. Ahner ... [et al.]
- 言語:
- 英語
- 出版情報:
- Warrendale, Pa. : Materials Research Society, c2004
- 形態:
- xii, 280 p. : ill. ; 24 cm.
- 著者名:
- シリーズ名:
- Materials Research Society symposium proceedings ; v. 803 <BA00013775>
- 書誌ID:
- BA6731177X
- ISBN:
- 9781558997417 [1558997415]
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