Rational fault analysis

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Rational fault analysis

フォーマット:

図書

責任表示:

edited by Richard Saeks, Stanley R. Liberty

言語:

英語

出版情報:

New York : M. Dekker, c1977

形態:

ix, 241 p. : ill. ; 24 cm

著者名:

シリーズ名:

Electrical engineering and electronics ; 1 <BA0010842X>

書誌ID:

BA03934943

ISBN:

9780824765415 [0824765419]

子書誌情報

所蔵情報

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主題:	Automatic checkout equipment--Congresses; Electronic apparatus and appliances--Reliability--Congresses; Electronic apparatus and appliances--Testing--Congresses
分類・件名:	LCC : TK7870 DDC : 621.3815/1/028 LCSH : Electronic apparatus and appliances -- Testing -- Congresses LCSH : Electronic apparatus and appliances -- Reliability -- Congresses LCSH : Automatic checkout equipment -- Congresses
LCCN:	76040363
注記:	Proceedings of the Symposium on Rational Fault Analysis held at Texas Tech University, August 19-20, 1974. Co-sponsored by the Office of Naval Research and the Army Research Office Includes bibliographies and index
TTLL:	eng

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