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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits : 2nd Edition

フォーマット:
電子ブック
責任表示:
edited by Manoj Sachdev, Jose Pineda de Gyvez
言語:
英語
出版情報:
Boston, MA : Springer, 2007
形態:
v.: digital
著者名:
シリーズ名:
Frontiers in Electronic Testing ; 34
書誌ID:
NB02214298
ISBN:
9780387465470 [0387465472]  CiNii Books  Webcat Plus  Google Books
学内からのみアクセスすることができます。
子書誌情報
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オンライン
http://dx.doi.org/10.1007/0-387-46547-2
所蔵情報
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