Introduction to Advanced System-on-Chip Test Design and Optimization

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Introduction to Advanced System-on-Chip Test Design and Optimization

フォーマット:

電子ブック

責任表示:

by Erik Larsson

言語:

英語

出版情報:

Boston, MA : Springer, 2005

形態:

v.: digital

著者名:

シリーズ名:

Frontiers in Electronic Testing ; 29

書誌ID:

NB02213722

ISBN:

9780387256245 [0387256245]

学内からのみアクセスすることができます。

子書誌情報

オンライン

http://dx.doi.org/10.1007/b135763

所蔵情報

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詳細

主題:	Electronic and Computer Engineering; Electronics and Microelectronics, Instrumentation; Engineering; Engineering Design; Optical and Electronic Materials
分類・件名:	LCSH : Computer engineering LCSH : Electronics LCSH : Engineering LCSH : Engineering design LCSH : Optical materials FREE : Engineering FREE : Electronic and Computer Engineering FREE : Electronics and Microelectronics, Instrumentation FREE : Engineering Design FREE : Optical and Electronic Materials
TTLL:	eng

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