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2000 IEEE International Reliability Physics Symposium proceedings : 38th annual, San Jose, California, April 10-13, 2000

フォーマット:
図書
責任表示:
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
言語:
英語
出版情報:
Piscataway, N. J. : Institute of Electrical and Electronics Engineers, c2000
形態:
viii, 455 p. ; 28 cm
著者名:
書誌ID:
BA49095628
ISBN:
9780780358607 [0780358600] (: soft.)  CiNii Books  Webcat Plus  Google Books
9780780358614 [0780358619] (: case.)  CiNii Books  Webcat Plus  Google Books
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